Publications

@article{J24b,

title = {Thermal Protection of Piezoelectric Actuators Using Complex Electrical Power Measurements and Simplified Thermal Models},

author = {Y. K. Yong and A. A. Eielsen and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2024/02/J24b-preprint.pdf},

doi = {10.1109/TMECH.2023.3277437},

isbn = {1083-4435},

year  = {2024},

date = {2024-01-01},

urldate = {2024-01-01},

journal = {IEEE/ASME Transactions on Mechatronics},

abstract = {This article describes a method for estimating the temperature of high-power piezoelectric actuators when a direct temperature measurement is impractical. The heat flow is estimated from the real component of the electrical power; then, the temperature is estimated by a transfer function that approximates the thermal response of the system. The transfer function can be derived analytically from a lumped-element approximation or calibrated experimentally by using a system identification method. The proposed method is demonstrated on a piezoelectric stack actuator used in a high-speed nanopositioning device. A second-order transfer function estimates the temperature to within 3  ∘ C of a reference measurement for a range of operating conditions. The proposed method is suitable for protecting piezoelectric actuators in applications where direct temperature measurement is impractical, for example, due to space or wiring constraints.},

keywords = {piezoelectric, System Identification, Thermal},

pubstate = {forthcoming},

tppubtype = {article}

}

@article{Ruppert2020,

title = {Amplitude Noise Spectrum of a Lock-in Amplifier: Application to Microcantilever Noise Measurements},

author = {M. G. Ruppert and N. J. Bartlett and Y. K. Yong and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2020/09/J20f.pdf},

doi = {10.1016/j.sna.2020.112092},

year  = {2020},

date = {2020-05-29},

urldate = {2020-05-29},

journal = {Sensors and Actuators A: Physical},

volume = {312},

pages = {112092},

abstract = {The lock-in amplifier is a crucial component in many applications requiring high-resolution displacement sensing; it's purpose is to estimate the amplitude and phase of a periodic signal, potentially corrupted by noise, at a frequency determined by a reference signal. Where the noise can be approximated by a stationary Gaussian process, such as thermal force noise and electronic sensor noise, this article derives the amplitude noise spectral density of the lock-in-amplifier output. The proposed method is demonstrated by predicting the demodulated noise spectrum of a microcantilever for dynamic-mode atomic force microscopy to determine the cantilever on-resonance thermal noise, the cantilever tracking bandwidth and the electronic noise floor. The estimates are shown to closely match experimental results over a wide range of operating conditions.},

note = {This work was supported by the Australian Research Council Discovery Project DP170101813},

keywords = {AFM, Cantilever, Demodulation, DP170101813, MEMS, System Identification},

pubstate = {published},

tppubtype = {article}

}

@article{Wang2019,

title = {Adaptive Scan for Atomic Force Microscopy Based on Online Optimisation: Theory and Experiment},

author = {K. Wang and M. G. Ruppert and C. Manzie and D. Nesic and Y. K. Yong},

url = {https://ieeexplore.ieee.org/document/8643730},

year  = {2019},

date = {2019-01-31},

journal = {IEEE Transactions on Control System Technology},

abstract = {A major challenge in Atomic Force Microscopy

(AFM) is to reduce the scan duration while retaining the

image quality. Conventionally, the scan rate is restricted to a

sufficiently small value in order to ensure a desirable image

quality as well as a safe tip-sample contact force. This usually

results in a conservative scan rate for samples that have a

large variation in aspect ratio and/or for scan patterns that

have a varying linear velocity. In this paper, an adaptive scan

scheme is proposed to alleviate this problem. A scan line-based

performance metric balancing both imaging speed and accuracy

is proposed, and the scan rate is adapted such that the metric

is optimised online in the presence of aspect ratio and/or linear

velocity variations. The online optimisation is achieved using an

extremum-seeking (ES) approach, and a semi-global practical

asymptotic stability (SGPAS) result is shown for the overall

system. Finally, the proposed scheme is demonstrated via both

simulation and experiment.},

note = {accepted for publication},

keywords = {AFM, Nanopositioning, SPM, System Identification, Tracking Control},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2018b,

title = {Self-sensing, estimation and control in multifrequency Atomic Force Microscopy. },

author = {M. G. Ruppert},

url = {https://royalsoc.org.au/images/pdf/journal/151-1-Ruppert.pdf},

issn = {0035-9173/18/010111-01},

year  = {2018},

date = {2018-06-01},

journal = {Journal & Proceedings of the Royal Society of New South Wales},

volume = {151},

number = {1},

pages = {111},

abstract = {Despite the undeniable success of the atomic force  microscope  (AFM),  dynamic  techniques still face limitations in terms of spatial resolution, imaging speed and high cost of acquisition. In order to expand the capabilities  of  the  instrument,  it  was  realized  that the information about the nano-mechanical properties  of  a  sample  are  encoded  over  a range of frequencies and the excitation and detection of higher-order eigenmodes of the micro-cantilever  open  up  further  informa-

tion  channels.  The  ability  to  control  these modes and their fast responses to excitation is believed to be the key to unravelling the true potential of these ethods. This work addresses  three  major  drawbacks  of  the standard AFM setup, which limit the feasibility of multi-frequency approaches.



First,   microelectromechanical   system (MEMS)  probes  with  integrated  piezoelectric layers is motivated, enabling the development of novel multimode self-sensing and self-actuating techniques. Specifically, these piezoelectric  transduction  schemes  permit the  miniaturization  of  the  entire  AFM towards  a  cost-effective  single-chip  device with nanoscale precision in a much smaller form factor than that of conventional macroscale instruments.



Second, the integrated actuation enables the development of multimode controllers which  exhibits  remarkable  performance  in arbitrarily  modifying  the  quality  factor  of multiple eigenmodes and comes with inherent  stability  robustness.  The  experimental results  demonstrate  improved  imaging  stability,  higher  scan  speeds  and  adjustable contrast  when  mapping  nano-mechanical properties of soft samples. 



Last, in light of the demand for constantly increasing  imaging  speeds  while  providing multi-frequency flexibility, the estimation of multiple components of the high-frequency deflection signal is performed with a linear time-varying multi-frequency Kalman filter. The chosen representation allows for an efficient high-bandwidth implementation on a Field  Programmable  Gate  Array. Tracking bandwidth, noise performance and trimodal AFM imaging on a two-component polymer sample  are  verified  and  shown  to  be  superior to that of the commonly used lock-in amplifier.},

keywords = {Cantilever, MEMS, Multifrequency AFM, Sensors, Smart Structures, SPM, System Identification, Vibration Control},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2017b,

title = {Note: Guaranteed collocated multimode control of an atomic force microscope cantilever using on-chip piezoelectric actuation and sensing},

author = {M. G. Ruppert and Y. K. Yong},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2017/08/2017_JNote_RSI_Vol88_086109-2.pdf},

doi = {10.1063/1.4990451},

year  = {2017},

date = {2017-08-15},

urldate = {2017-08-15},

journal = {Review of Scientific Instruments},

volume = {88},

number = {086109},

abstract = {The quality (Q) factor is an important parameter of the resonance of the microcantilever as it determines

both imaging bandwidth and force sensitivity. The ability to control the Q factor of multiple

modes is believed to be of great benefit for atomic force microscopy techniques involving multiple

eigenmodes. In this paper, we propose a novel cantilever design employing multiple piezoelectric

transducers which are used for separated actuation and sensing, leading to guaranteed collocation

of the first eight eigenmodes up to 3 MHz. The design minimizes the feedthrough usually observed

with these systems by incorporating a guard trace on the cantilever chip. As a result, a multimode

Q controller is demonstrated to be able to modify the quality factor of the first two eigenmodes over

up to four orders of magnitude without sacrificing robust stability.},

note = {This work was supported by the Australian Research Council Discovery Project DP170101813},

keywords = {AFM, Cantilever, DP170101813, MEMS, Multifrequency AFM, Piezoelectric Transducers and Drives, System Identification, Vibration Control},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2016b,

title = {Multimode Q Control in Tapping-Mode AFM: Enabling Imaging on Higher Flexural Eigenmodes},

author = {M. G. Ruppert and S. O. R. Moheimani},

doi = {10.1109/TCST.2015.2478077},

year  = {2016},

date = {2016-07-01},

journal = {IEEE Transactions on Control Systems Technology},

volume = {24},

number = {4},

pages = {1149-1159},

abstract = {Numerous dynamic Atomic Force Microscopy (AFM) methods have appeared in recent years, which make use of the excitation and detection of higher order eigenmodes of the microcantilever. The ability to control these modes and their responses to excitation is believed to be the key to unraveling the true potential of these methods. In this work, we highlight a multi-mode Q control method that exhibits remarkable damping performance and stability robustness. The experimental results obtained in ambient conditions demonstrate improved imaging stability by damping non-driven resonant modes when scanning is performed at a higher eigenmode of the cantilever. Higher scan speeds are shown to result from a decrease in transient response time. },

keywords = {MEMS, Multifrequency AFM, SPM, System Identification, Vibration Control},

pubstate = {published},

tppubtype = {article}

}

@article{Karvinen2014,

title = {Direct Tip-Sample Force Estimation for High-Speed Dynamic Mode Atomic Force Microscopy},

author = {K. S. Karvinen and M. G. Ruppert and K. Mahata and S. O. R. Moheimani},

doi = {10.1109/TNANO.2014.2360878},

year  = {2014},

date = {2014-11-01},

journal = {IEEE Transactions on Nanotechnology},

volume = {13},

number = {6},

pages = {1257-1265},

abstract = {We present new insights into the modeling of the microcantilever in dynamic mode atomic force microscopy and outline a novel high-bandwidth tip-sample force estimation technique for the development of high-bandwidth z-axis control. Fundamental to the proposed technique is the assumption that in tapping mode atomic force microscopy, the tip-sample force takes the form of an impulse train. Formulating the estimation problem as a Kalman filter, the tip-sample force is estimated directly; thus, potentially enabling high-bandwidth z-axis control by eliminating the dependence of the control technique on microcantilever dynamics and the amplitude demodulation technique. Application of this technique requires accurate knowledge of the models of the microcantilever; a novel identification method is proposed. Experimental data are used in an offline analysis for verification.},

keywords = {SPM, System Identification},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2013b,

title = {A novel self-sensing technique for tapping-mode atomic force microscopy},

author = {M. G. Ruppert and S. O. R. Moheimani},

doi = {http://dx.doi.org/10.1063/1.4841855},

year  = {2013},

date = {2013-12-01},

journal = {Review of Scientific Instruments},

volume = {84},

number = {12},

pages = {125006},

abstract = {This work proposes a novel self-sensing tapping-mode atomic force microscopy operation utilizing charge measurement. A microcantilever coated with a single piezoelectric layer is simultaneously used for actuation and deflection sensing. The cantilever can be batch fabricated with existing Micro Electro Mechanical System processes. The setup enables the omission of the optical beam deflection technique which is commonly used to measure the cantilever oscillation amplitude. Due to the high amount of capacitive feedthrough in the measured charge signal, a feedforward control technique is employed to increase the dynamic range from less than 1dB to approximately 35dB. Experiments show that the conditioned charge signal achieves excellent signal-to-noise ratio and can therefore be used as a feedback signal for AFM imaging.},

keywords = {MEMS, Smart Structures, SPM, System Identification},

pubstate = {published},

tppubtype = {article}

}

@article{J03e,

title = {Spatial system identification of a simply supported beam and a trapezoidal cantilever plate},

author = {A. J. Fleming and S. O. R. Moheimani},

url = {https://www.precisionmechatronicslab.com/wp-content/publications/J03e.pdf},

year  = {2003},

date = {2003-01-01},

journal = {IEEE Transactions on Control Systems Technology},

volume = {11},

number = {5},

pages = {726--736},

keywords = {System Identification},

pubstate = {published},

tppubtype = {article}

}

@article{J02b,

title = {Subspace-based system identification for an acoustic enclosure},

author = {T. McKelvey and A. J. Fleming and S. O. R. Moheimani},

url = {https://www.precisionmechatronicslab.com/wp-content/publications/J02b.pdf},

year  = {2002},

date = {2002-01-01},

journal = {Transactions of the ASME, Journal of Vibration & Acoustics},

volume = {124},

number = {3},

pages = {414--419},

keywords = {System Identification},

pubstate = {published},

tppubtype = {article}

}