Date & Venue Tuesday, 04 February 2020, 04:00pm EF122 Abstract The Atomic Force Microscope (AFM) has emerged as an indispensable research tool in the development of nanoscience and nanotechnology. Piezoelectrically actuated nanopositioning stages are widely employed in AFMs to realize accurate the positioning of the sample-to-be-scanned, due to several performance advantages such as fine resolution, [...]
Date & Venue Monday, 10 February 2020, 10:00am EF122 AbstractThe atomic force microscope (AFM) is a versatile tool that can operate in contact or dynamic mode on metallic, semiconductor, insulator or biological samples in liquid, air and vacuum environments. The sensor and the operational mode of an AFM must be selected a priori before each [...]
Date & Venue Wednesday, 11 December 2019, 02:00pm EF122 Abstract In order to recover from fractures suffered in the limbs, intramedullary (IM) rods are inserted into the bone marrow canal. When in place, the IM rods ensure proper alignment of the fracture which allows the bone to heal naturally. However the removal of IM rods [...]
Date & Venue Wednesday, 20 November 2019, 11:00am EF122 Abstract This talk has two (for now) loosely connected parts: In the first part we aim to provide intuition for the key mechanisms underlying the sequential Monte Carlo (SMC) method (including the popular particle filters and smoothers). SMC provide approximate solutions to integration problems where there [...]
Date & Venue:Monday, 25 November 2019, 03:00pmEF122 Abstract:The microcantilever is a precision microelectromechanical systems (MEMs) device and an integral component of a myriad of systems which have collectively enabled the steady progress in nanotechnology over the past three decades. It is a key component and sits at the heart of a variety of instruments for [...]
Date & Venue:Tuesday, 29 October 2019EF122 Abstract: This article describes the design and fabrication of fiber-reinforced soft actuators for a worm-like robot designed to operate inside constrained tubes. The actuators include bending, extension and torsion. These actuators are experimentally characterised by measuring the deflection versus applied pressure. The results demonstrate that fiber wrapping pattern, geometry [...]
Date & Venue: Friday, 18 October 2019 EF122 Abstract: An atomic force microscope consists of three basic components: a microcantilever with a sharp probe at one end, an XYZ nanopositioner, and an optical beam deflection system to measure the tip deflection of the microcantilever due to interaction forces between the tip and sample. It is [...]
Date & VenueTuesday, 17 July 2019, 1:00pmEF122 Figure: AFM topographic, TERS and surface potential images of WSe2 flakes. AbstractRaman spectroscopy and confocal Raman microscopy have already proved to be essential characterization tools in many areas of advanced research, with a number of these applications extending into industry. As time moves on, new applications that are [...]
Date & Venue Tuesday, 26 March 2019, 3:00pm EF122 Abstract The next generation of integrated circuits will be mass produced using extreme ultra violet lithography (EUV). The short wavelength light sources and optical masks required are prohibitively expensive with commercial systems costing upwards of $1M. Furthermore, the optical masks are unique to each IC design. [...]
Date & VenueFriday, 08 March 2019, 02:00pmEF122 Abstract Motion control has been used in automation applications such as numerically controlled machine tools for many years. With the advent of low cost microelectronics, motion control has spread into new products that often require extremely high performance position control. Examples of this are hard drives head positioning, [...]